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then the validation should be repeated after verifying the physical measurement upon which the prediction is based and any other parameters deemed suspect
in unambiguous terms
measured results for three different edge profile types are given as examples in Related Information 1 at the end of this Standard
but they may also be applied to wafers of other materials
SEMI D20-0706 (technical revision)
HB00700 - SEMI HB7 - Test Method for Measurement of Waviness of Crystalline Sapphire Wafers by Using Optical Probes Revision:SEMI HB7-0615 - Current then the validation should beThis Standard was technically approved by the HB LED Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 19, 2015. Available at www. semiviews. org and www. semi. org in June 2015. Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices, in particular high brightness light emitting diodes (HB LED). In SEMI HB1 a multitude of
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